Oxford X-MET5000 Handheld XRF Analyzer
Oxford Instruments' portable XRF (X-ray fluorescence) analysers
X-MET5100 and X-MET5000:
For fastest scrap metal sorting and analysis (often called a ‘metal
analysis gun’)
For high speed PMI (Positive Material Identification) and QC/QA
For fast and reliable compliance screening of restricted elements
('elemental analyser')
For high speed reliable mine mapping and on-site ore analysis
For fast on-site heavy metal analysis of soils ('soil analyser')
X-MET hand-held XRF analysers are specifically designed for:
positive material identification (PMI)
metal identification/scrap sorting
analysis of alloys and hazardous material analysis (RoHS screening)
analysis of heavy metals in soils on polluted lands and ores at mining sites
screening for lead in toys
detection of lead in paint
Extensive and open grade library
The X-MET allows easy easy editing of the grade libraries, including
the addition of new alloys and naming of alloys. The integrated grade
library contains:
Nickel Alloys, Stainless Steels, Cobalt Alloys, Low Alloy Steel, Tool
Steels, Copper Alloys, Titanium Alloys, Zirconium Alloys, Aluminium
Alloys
The X-MET is capable of storing thousands of grade identifications and
it’s easy to add new elements or to create a custom library.
The top of the range X-MET5100 combines Oxford Instruments’
groundbreaking Silicon Drift Detector (SDD) with a powerful 45kV X-ray
tube. This cutting edge technology delivers a five times faster
measurement speed, much better detection limits and significant
accuracy improvement over conventional systems.
Isn’t it time you used X-MET to improve your productivity?
Engineered for high performance and reliability, this hand-held XRF
analyser combines Oxford Instruments’ patented PentaPIN® detector
technology offering guaranteed fast analysis and lower limits of
detection for all elements of interest.
X-MET5000 XRF hand-held analyzer is built for the most demanding
quality control applications:
scrap metal analysis & sorting - analysis of metals for PMI - consumer
products for RoHS screening - lead in toys - compliance testing - ore
exploration in mining processes - heavy metals monitoring in soils
Silicon Drift Detector technology improves your productivity saving you money!
The X-MET5000 combines Oxford Instruments' ground breaking Silicon
Drift Detector (SDD) with our own purpose built powerful 45kV X-ray
tube. This cutting edge technology delivers a five times faster
measurement speed, improved detection limits and significant accuracy
improvement over conventional systems.
This rugged and reliable portable XRF analyzer is IP54 (NEMA 3)
approved for superior dust and splash protection.
The X-MET5000 range is perfect for the harshest environments. The
battery operating time of one working day is unique and enables
extended productivity without returning to base.
The powerful user programmable software delivers highly accurate
results for reliable Go/No-Go decisions.
The X-MET5000 will identify material type and automatically choose the
best XRF analysis method.
Rugged, reliable tool for fast, accurate analysis
1 metre (3 ft) drop test
safety tested
technology based on over 30 years XRF experience!
X-ray tube for optimized performance and maximum safety
No isotope means
No regulatory controls
No travel restrictions
No licensing costs
No disposal problems
In-built safety features mean extra user protection
PDA based technology for flexibility and simplicity
bright color touch screen display with easy-to-use menu
wireless transfer and off-the-shelf commercial PDA
easily replace and full Windows CE functionality
PC compatible and data back-up flash card
customizable, transferable and unlimited storage of results
Easy to User
brief operation training
point and shoot analysis
no special knowledge required
intuitive user interface
X-MET5100 and X-MET5000:
For fastest scrap metal sorting and analysis (often called a ‘metal
analysis gun’)
For high speed PMI (Positive Material Identification) and QC/QA
For fast and reliable compliance screening of restricted elements
('elemental analyser')
For high speed reliable mine mapping and on-site ore analysis
For fast on-site heavy metal analysis of soils ('soil analyser')
X-MET hand-held XRF analysers are specifically designed for:
positive material identification (PMI)
metal identification/scrap sorting
analysis of alloys and hazardous material analysis (RoHS screening)
analysis of heavy metals in soils on polluted lands and ores at mining sites
screening for lead in toys
detection of lead in paint
Extensive and open grade library
The X-MET allows easy easy editing of the grade libraries, including
the addition of new alloys and naming of alloys. The integrated grade
library contains:
Nickel Alloys, Stainless Steels, Cobalt Alloys, Low Alloy Steel, Tool
Steels, Copper Alloys, Titanium Alloys, Zirconium Alloys, Aluminium
Alloys
The X-MET is capable of storing thousands of grade identifications and
it’s easy to add new elements or to create a custom library.
The top of the range X-MET5100 combines Oxford Instruments’
groundbreaking Silicon Drift Detector (SDD) with a powerful 45kV X-ray
tube. This cutting edge technology delivers a five times faster
measurement speed, much better detection limits and significant
accuracy improvement over conventional systems.
Isn’t it time you used X-MET to improve your productivity?
Engineered for high performance and reliability, this hand-held XRF
analyser combines Oxford Instruments’ patented PentaPIN® detector
technology offering guaranteed fast analysis and lower limits of
detection for all elements of interest.
X-MET5000 XRF hand-held analyzer is built for the most demanding
quality control applications:
scrap metal analysis & sorting - analysis of metals for PMI - consumer
products for RoHS screening - lead in toys - compliance testing - ore
exploration in mining processes - heavy metals monitoring in soils
Silicon Drift Detector technology improves your productivity saving you money!
The X-MET5000 combines Oxford Instruments' ground breaking Silicon
Drift Detector (SDD) with our own purpose built powerful 45kV X-ray
tube. This cutting edge technology delivers a five times faster
measurement speed, improved detection limits and significant accuracy
improvement over conventional systems.
This rugged and reliable portable XRF analyzer is IP54 (NEMA 3)
approved for superior dust and splash protection.
The X-MET5000 range is perfect for the harshest environments. The
battery operating time of one working day is unique and enables
extended productivity without returning to base.
The powerful user programmable software delivers highly accurate
results for reliable Go/No-Go decisions.
The X-MET5000 will identify material type and automatically choose the
best XRF analysis method.
Rugged, reliable tool for fast, accurate analysis
1 metre (3 ft) drop test
safety tested
technology based on over 30 years XRF experience!
X-ray tube for optimized performance and maximum safety
No isotope means
No regulatory controls
No travel restrictions
No licensing costs
No disposal problems
In-built safety features mean extra user protection
PDA based technology for flexibility and simplicity
bright color touch screen display with easy-to-use menu
wireless transfer and off-the-shelf commercial PDA
easily replace and full Windows CE functionality
PC compatible and data back-up flash card
customizable, transferable and unlimited storage of results
Easy to User
brief operation training
point and shoot analysis
no special knowledge required
intuitive user interface
$
6,825.00
Oxford HORIZONPbi Handheld XRF analyzer
HORIZONPbi is a handheld analyser for the determination of Lead in paint.
Easy and safe to use
Accurate and fast analysis (2 seconds)
Analysis on all surfaces
Display of depth of Lead provenance
User friendly:
Simple to use colour touchscreen and user interface
Easy room selection
Report generator program
High performance Windows (TM) PDA and PC software
French language user interface
Data export under Excel
Lightweight, long-lasting rechargeable Lithium-ion batteries
Radioactive source: Cadmium 109, 20 mCi
Simultaneous detection of Lead L and K line
Easy and safe to use
Accurate and fast analysis (2 seconds)
Analysis on all surfaces
Display of depth of Lead provenance
User friendly:
Simple to use colour touchscreen and user interface
Easy room selection
Report generator program
High performance Windows (TM) PDA and PC software
French language user interface
Data export under Excel
Lightweight, long-lasting rechargeable Lithium-ion batteries
Radioactive source: Cadmium 109, 20 mCi
Simultaneous detection of Lead L and K line
$
4,590.00
Oxford X-Supreme8000
Rapid results
-Simultaneous single or multi-element analysis with ‘Live
Updates’ – results obtained 5 seconds after measurement
starts, allowing a rapid assessment to be made
-Results obtained using empirical calibrations for highest accuracy
and traceability. Optional Standardless (Fundamental Parameter)
Analysis where no or very few standards are available
-Rugged and reliable
operation on a 24/7
basis carried out
by laboratory or
shift personnel
-Application optimised, high performance
solutions
-Oxford Instruments’ X-ray tubes with W,
Pd or Ti target and state of the art high
resolution large area Silicon Drift (SDD)
or proportional detector
Minimum bench space
Integrated PC – compact
-Large, easy to read colour graphics for
clarity and ease of use
• Touch screen display (optional) for simple
and rapid data input
• High performance, reliable, embedded
PC with Windows XP
Easy communication
• Easy access USB ports on side/underneath
PC module for peripheral devices
• Ethernet connection for; transmission
of results, interface to Laboratory
Information Management System (LIMS)
or remote operation and diagnostics
Rugged and robust design
Sealed membrane keypad resistant to dust, oils,
solvents etc.
• Internal ‘wind tunnel’ design – cooling fans do
not carry dust to sensitive internal components
• Secondary easy-to-change safety window for
liquids/powder analysis protects the instrument
in the event of sample leakage
Unattended operation
• 10 sample positions with ability to measure QC sample during run
giving total confidence in analytical results
• Sample spinner (optional) – reduces errors due to sample preparation,
particle size and inhomogeneity
• Optional large trays for holding 51.5 mm (2”) diameter steel ring for
cement application, or 47 mm diameter filter samples
• Range of Oxford Instruments’ sample holders for easy sample loading
-Simultaneous single or multi-element analysis with ‘Live
Updates’ – results obtained 5 seconds after measurement
starts, allowing a rapid assessment to be made
-Results obtained using empirical calibrations for highest accuracy
and traceability. Optional Standardless (Fundamental Parameter)
Analysis where no or very few standards are available
-Rugged and reliable
operation on a 24/7
basis carried out
by laboratory or
shift personnel
-Application optimised, high performance
solutions
-Oxford Instruments’ X-ray tubes with W,
Pd or Ti target and state of the art high
resolution large area Silicon Drift (SDD)
or proportional detector
Minimum bench space
Integrated PC – compact
-Large, easy to read colour graphics for
clarity and ease of use
• Touch screen display (optional) for simple
and rapid data input
• High performance, reliable, embedded
PC with Windows XP
Easy communication
• Easy access USB ports on side/underneath
PC module for peripheral devices
• Ethernet connection for; transmission
of results, interface to Laboratory
Information Management System (LIMS)
or remote operation and diagnostics
Rugged and robust design
Sealed membrane keypad resistant to dust, oils,
solvents etc.
• Internal ‘wind tunnel’ design – cooling fans do
not carry dust to sensitive internal components
• Secondary easy-to-change safety window for
liquids/powder analysis protects the instrument
in the event of sample leakage
Unattended operation
• 10 sample positions with ability to measure QC sample during run
giving total confidence in analytical results
• Sample spinner (optional) – reduces errors due to sample preparation,
particle size and inhomogeneity
• Optional large trays for holding 51.5 mm (2”) diameter steel ring for
cement application, or 47 mm diameter filter samples
• Range of Oxford Instruments’ sample holders for easy sample loading
$
7,350.00
Oxford Lab-X3500
Specifications
Analyzer Type Single Channel
Sample Type Solids; Liquids
User Interface Options
User Interface Digital Front Panel
Remote Interface Application Software Included. (optional feature)
industries using the Lab-X3500 for cost effective quality control
include: petrochemical - minerals - cement - ceramics - cosmetics -
toiletries - paper - general chemicals measuring a range of elements
from Mg to U
Analyzer Type Single Channel
Sample Type Solids; Liquids
User Interface Options
User Interface Digital Front Panel
Remote Interface Application Software Included. (optional feature)
industries using the Lab-X3500 for cost effective quality control
include: petrochemical - minerals - cement - ceramics - cosmetics -
toiletries - paper - general chemicals measuring a range of elements
from Mg to U
$
980.00
oxford MDX1000
Oxford Instruments Analytical has been at the forefront of X-ray technology
since the early 1970’s, when the first Energy Dispersive X-Ray Fluorescence
(EDXRF) analyser was produced. Advances in technology have led to the
development of the unique combination of both Wavelength Dispersive
(WDXRF) and EDXRF, to be found in the MDX1000.
Many hundreds of these instruments have been delivered world-wide, with
around 80% being exported. This commitment to overseas markets is
demonstrated by wholly owned subsidiaries in the USA, Germany, France and
Japan and by an extensive network of agents, providing world-wide service and
support.
Autosampler option for 1-72 samples
• Unattended analysis
• Overnight runs
• Operation under full software control
• Calibration and automatic
restandardisation
Minimal sample preparation
• Liquid and granules poured directly into
sample cell
• Powders analysed ‘as received’ or ground
and pressed into a pellet
• Metals ground or turned to a flat surface
• No precise weighing
• No volumetric measurement
since the early 1970’s, when the first Energy Dispersive X-Ray Fluorescence
(EDXRF) analyser was produced. Advances in technology have led to the
development of the unique combination of both Wavelength Dispersive
(WDXRF) and EDXRF, to be found in the MDX1000.
Many hundreds of these instruments have been delivered world-wide, with
around 80% being exported. This commitment to overseas markets is
demonstrated by wholly owned subsidiaries in the USA, Germany, France and
Japan and by an extensive network of agents, providing world-wide service and
support.
Autosampler option for 1-72 samples
• Unattended analysis
• Overnight runs
• Operation under full software control
• Calibration and automatic
restandardisation
Minimal sample preparation
• Liquid and granules poured directly into
sample cell
• Powders analysed ‘as received’ or ground
and pressed into a pellet
• Metals ground or turned to a flat surface
• No precise weighing
• No volumetric measurement
$
3,450.00
Oxford CMI900 Thickness and Material Composition
CMI900 - For Measurement of Coating Thickness and Material Composition
CMI900
CMI900 is a cost effective, high performance XRF analyser for
measurement of coating thickness and material composition.
Measure the thickness and/or composition of plating, coating, thin films
from Ti to U
5 layers / 15 elements / Common elements correction
Composition analysis of up to 15 elements simultaneously
Features:
Standard 50 Watt Micro-Focus X-ray Tube
Increased count rate, improved precision
75 W upgrade
Multiple Collimators
Optimize the balance between count rate and spot sizes
Laser Focus
Improves system reproducibility (operator independent)
Standard FP Software Package
Complex application modeling
Ease of calibration
Slotted Chamber with motorized Z axis control
CMI900
CMI900 is a cost effective, high performance XRF analyser for
measurement of coating thickness and material composition.
Measure the thickness and/or composition of plating, coating, thin films
from Ti to U
5 layers / 15 elements / Common elements correction
Composition analysis of up to 15 elements simultaneously
Features:
Standard 50 Watt Micro-Focus X-ray Tube
Increased count rate, improved precision
75 W upgrade
Multiple Collimators
Optimize the balance between count rate and spot sizes
Laser Focus
Improves system reproducibility (operator independent)
Standard FP Software Package
Complex application modeling
Ease of calibration
Slotted Chamber with motorized Z axis control
$
2,876.00
oxford X-Strata 980
Combining a high power X-ray tube and high resolution detector, the
X-Strata980 X-ray Fluorescence analyser delivers limits of detection
in single digit ppms!
Measure the thickness and/or composition of plating, coatings, and
films, containing elements from S through U
5 layers / 15 elements / Common elements correction
Composition analysis of up to 25 elements simultaneously
Features:
100W X-ray tube and 25mm2 Peltier cooled PIN detector
Multiple collimators
Simultaneous analysis of thickness and composition
Mapping software
Combined calibration method
Color-coded pass/fail results
Giant chamber
Spectifications;
X-ray excitation
100W (50kV and 2mA) micro-focus tungsten anode tube
Detector
25mm2 PIN detector with Peltier cooling
Filters/Collimators
Up to 4 primary filters
Up to 4 collimators (0.1, 0.2, 0.3, 1.27mm Ø)
Digital Pulse Processing
4096 CH digital multi-channel analyzer
Automatic signal processing including dead time correction and pulse
pile up rejection
Computer/Display/OS
Celeron, 1.86 GHz, 40 GbHD, 512Mb RAM, equivalent or better
15”LCD, 1024 x 768
MicrosoftTM XP SP2
Power Supply
85~130 or 215~265 volts, with frequency range of 47Hz to 63Hz
Working Environment
50°F (10°C) to 104°F (40°C) and up to 98% RH, non-condensing
XYZ Travel
203 x 152 x 216 mm (8 x 6 x 8.5”) fully programmable
Trace analysis of hazardous substances (RoHS/ELV/WEEE)
Multi-layer coating thickness and/or composition analysis
Alloy identification and chemistry analysis
Plating solution analysis
Gold karat assay
Oxford Instruments offers a full range of instruments dedicated to the
electronics manufacturing industry. Our XRF instruments are available
in different configurations for RoHS compliance screening and testing.
When testing for the presence of lead, as with high-reliablity
electronics, the X-Strata980 can assure quality
X-Strata980 X-ray Fluorescence analyser delivers limits of detection
in single digit ppms!
Measure the thickness and/or composition of plating, coatings, and
films, containing elements from S through U
5 layers / 15 elements / Common elements correction
Composition analysis of up to 25 elements simultaneously
Features:
100W X-ray tube and 25mm2 Peltier cooled PIN detector
Multiple collimators
Simultaneous analysis of thickness and composition
Mapping software
Combined calibration method
Color-coded pass/fail results
Giant chamber
Spectifications;
X-ray excitation
100W (50kV and 2mA) micro-focus tungsten anode tube
Detector
25mm2 PIN detector with Peltier cooling
Filters/Collimators
Up to 4 primary filters
Up to 4 collimators (0.1, 0.2, 0.3, 1.27mm Ø)
Digital Pulse Processing
4096 CH digital multi-channel analyzer
Automatic signal processing including dead time correction and pulse
pile up rejection
Computer/Display/OS
Celeron, 1.86 GHz, 40 GbHD, 512Mb RAM, equivalent or better
15”LCD, 1024 x 768
MicrosoftTM XP SP2
Power Supply
85~130 or 215~265 volts, with frequency range of 47Hz to 63Hz
Working Environment
50°F (10°C) to 104°F (40°C) and up to 98% RH, non-condensing
XYZ Travel
203 x 152 x 216 mm (8 x 6 x 8.5”) fully programmable
Trace analysis of hazardous substances (RoHS/ELV/WEEE)
Multi-layer coating thickness and/or composition analysis
Alloy identification and chemistry analysis
Plating solution analysis
Gold karat assay
Oxford Instruments offers a full range of instruments dedicated to the
electronics manufacturing industry. Our XRF instruments are available
in different configurations for RoHS compliance screening and testing.
When testing for the presence of lead, as with high-reliablity
electronics, the X-Strata980 can assure quality
$
8,990.00
Oxford X-Strata 960
The X-Strata 960 builds upon the solid foundations established by the
CMI900 series The new design includes:
New 100 watt X-ray tube is the most powerful tube available – 30%
increase in precision at the same measurement/50% decrease in
measurement time at the same precision.
Smaller X-ray spot size – Measure even smaller features in electronic
components with the new 15µm collimator. Offers improved CCD camera
and zoom stage and high precision Y Stage.
Distance Independent Measuring (DIM) – More flexibility to measure
oddly shaped samples – sample surface can be measured anywhere within
the DIM range 12.5-90mm (0.5”-3.5”) with a total Z travel of 230mm
(9"). Offers quick, precise sample alignment by manually adjusting the
DIM knob or by using the Auto Laser Focus.
Auto Laser Focus – automatically finds the correct focal distance to
improve the focusing process for DIM and improve system
reproducability. The standard laser focus is still available.
New Giant Sample Chamber – Large open chamber
(580x510x230mm:23x20x9”) is slotted for oversize samples and is easy
to load and view from any direction
3 Table Options – XY programmable (200x200mm or 12x8” travel)/XY
manual (250x250mm or 10x10”)/Fixed position … plus, motorized Z axis
as standard with 230mm (9”) travel
Integrated PC and user interface.
CMI900 series The new design includes:
New 100 watt X-ray tube is the most powerful tube available – 30%
increase in precision at the same measurement/50% decrease in
measurement time at the same precision.
Smaller X-ray spot size – Measure even smaller features in electronic
components with the new 15µm collimator. Offers improved CCD camera
and zoom stage and high precision Y Stage.
Distance Independent Measuring (DIM) – More flexibility to measure
oddly shaped samples – sample surface can be measured anywhere within
the DIM range 12.5-90mm (0.5”-3.5”) with a total Z travel of 230mm
(9"). Offers quick, precise sample alignment by manually adjusting the
DIM knob or by using the Auto Laser Focus.
Auto Laser Focus – automatically finds the correct focal distance to
improve the focusing process for DIM and improve system
reproducability. The standard laser focus is still available.
New Giant Sample Chamber – Large open chamber
(580x510x230mm:23x20x9”) is slotted for oversize samples and is easy
to load and view from any direction
3 Table Options – XY programmable (200x200mm or 12x8” travel)/XY
manual (250x250mm or 10x10”)/Fixed position … plus, motorized Z axis
as standard with 230mm (9”) travel
Integrated PC and user interface.
$
7,550.00
Oxford X-MET3000 Plus
The X-MET3000+ is a rugged, handheld XRF analyzer, which incorporates
advanced X-ray tube technology. The XMET3000+ is capable analyzing
element from Titanium (22) to Uranium (92) and Chlorine (18) to
Uranium (92) for RoHS and Soil model (XMET 3000 TXR+ and XMET 3000
TXS+)
New – Now all the XMET 3000 Plus model is equipped with the new
developed and patented detector from Oxford Instruments, Penta PIN
Detector. It will produce a Low resolution - high count rate. It has
best detection limits in handheld instrument. Furthermore it will
improved precision from higher count rate. It will also produce better
inter-element correction due to improved resolution and background.
Measurements with the X-MET3000TX, can utilise four types of method of
measurement.
1. The Empirical Assay Calibration mode
Fastest and most accurate analysis
Traceable reference standards are used to establish the calibration
Particularly useful where all major elements present in a sample
cannot be analyzed (e.g. metallic carbides)
2. Fundamental Parameters (FP) is a universal standardless calibration
Practically any combination of physically measurable elements can be
analyzed accurately.
Can measure 25 elements between Ti-U regardless of concentration
The elements analyzed can be customized for specific applications
3. Direct spectral identification
Is based on the comparison of known standard spectra and the measured
spectrum of the sample
The material can be identified even when no analytical assay data is available
4. PASS/FAIL mode offers a convenient, fast way fast way to sort material,
e.g. during delivery inspection
XMET3000 is developed in several different models to be used in a
specific or general applications, as follows:
Metal alloy analysis or Positive Material Identification (PMI)
Scrap Sorting
WEEE, RoHS, Pb-free, packaging & ELV analyzer
Soil analysis
advanced X-ray tube technology. The XMET3000+ is capable analyzing
element from Titanium (22) to Uranium (92) and Chlorine (18) to
Uranium (92) for RoHS and Soil model (XMET 3000 TXR+ and XMET 3000
TXS+)
New – Now all the XMET 3000 Plus model is equipped with the new
developed and patented detector from Oxford Instruments, Penta PIN
Detector. It will produce a Low resolution - high count rate. It has
best detection limits in handheld instrument. Furthermore it will
improved precision from higher count rate. It will also produce better
inter-element correction due to improved resolution and background.
Measurements with the X-MET3000TX, can utilise four types of method of
measurement.
1. The Empirical Assay Calibration mode
Fastest and most accurate analysis
Traceable reference standards are used to establish the calibration
Particularly useful where all major elements present in a sample
cannot be analyzed (e.g. metallic carbides)
2. Fundamental Parameters (FP) is a universal standardless calibration
Practically any combination of physically measurable elements can be
analyzed accurately.
Can measure 25 elements between Ti-U regardless of concentration
The elements analyzed can be customized for specific applications
3. Direct spectral identification
Is based on the comparison of known standard spectra and the measured
spectrum of the sample
The material can be identified even when no analytical assay data is available
4. PASS/FAIL mode offers a convenient, fast way fast way to sort material,
e.g. during delivery inspection
XMET3000 is developed in several different models to be used in a
specific or general applications, as follows:
Metal alloy analysis or Positive Material Identification (PMI)
Scrap Sorting
WEEE, RoHS, Pb-free, packaging & ELV analyzer
Soil analysis
$
4,690.00
Oxford Mobile OES Analyzer for alloy analysis ARC-MET8000
ARC-MET8000 analyzer offers:
Fast analysis and sorting
Carbon analysis in air from low alloy steel
Superior analytical quality
Ease of use
Repeatble results for Carbon, Sulfur, Phosphorus and Boron
Expandable assay models
Rugged design
Convenient mobility
Versatility - Easy interchange between ARGON or AIR
Battery operation
Availability of ARGON and AIR measurements makes ARC-MET8000 MobileLab
a useful tool in all segments of metals industry
scrap sorting
metallurgical manufacturing
oil refineries
petrochemical and chemical industry
aviation
military
power plants
As a high performance analyzer, it meets the needs of demanding
inspection companies
The New Unique OES feature: Carbon analysis in AIR
Carbon can be analyzed without argon using the standard 193 nm line
giving sorting capabilities that have never before existed. The carbon
content of concave and other complex surfaces, which make Argon
sealing difficult, can now be measured easily.
ARC-MET8000 is Ideal analyzer for ferrous and non-ferrous metals
Low Alloy Steels
Stainless Steels
Tool Steels
Low Alloy (white) Cast Iron
Aluminum Alloys
Titanium Alloys
Nickel Alloys
Cobalt Alloys
Copper Alloys
Zinc Alloys
Magnesium Alloys
Ask for others
Fast analysis and sorting
Carbon analysis in air from low alloy steel
Superior analytical quality
Ease of use
Repeatble results for Carbon, Sulfur, Phosphorus and Boron
Expandable assay models
Rugged design
Convenient mobility
Versatility - Easy interchange between ARGON or AIR
Battery operation
Availability of ARGON and AIR measurements makes ARC-MET8000 MobileLab
a useful tool in all segments of metals industry
scrap sorting
metallurgical manufacturing
oil refineries
petrochemical and chemical industry
aviation
military
power plants
As a high performance analyzer, it meets the needs of demanding
inspection companies
The New Unique OES feature: Carbon analysis in AIR
Carbon can be analyzed without argon using the standard 193 nm line
giving sorting capabilities that have never before existed. The carbon
content of concave and other complex surfaces, which make Argon
sealing difficult, can now be measured easily.
ARC-MET8000 is Ideal analyzer for ferrous and non-ferrous metals
Low Alloy Steels
Stainless Steels
Tool Steels
Low Alloy (white) Cast Iron
Aluminum Alloys
Titanium Alloys
Nickel Alloys
Cobalt Alloys
Copper Alloys
Zinc Alloys
Magnesium Alloys
Ask for others
$
8,615.00
Oxford PMI-MASTER PRO Spark Emission Spectrometer
UVTouch - The New Smarter Probe for PMI-MASTER PRO
We are proud to introduce you a a new, unique, detachable probe to be
used with our PMI-MASTER PRO analyser.
With the new UVTouch you have all analysis information available on
the probe – and without any compromise in analytical precision or
elements to be determined.
Robust technology allows continuous use in any location, even in
rugged conditions
No more working with heavy items on ladders or scaffolds. Just take
the UVTouch probe and leave the spectrometer on the floor level!
This is the only analyser with an optional 10 m flexible connection
cable – ideal for difficult to reach areas.
To new extensions with the new OES UVTouch probe!!
Fast analysis, quick verification of results and sorting of material even on
remote, difficult and hard to reach areas in industrial yards – just
using the probe and its straightforward user interface
Long connection cable between the probe and main unit enables an
operation radius of 10 metres from the main PMI-MASTER PRO unit
User interface on a probe – optimal contrast properties to view any
lighting conditions inside and outside
Results displayed on both the probe and main unit thanks to an
automatic high-speed connection between the systems
Easy access to sample surfaces thanks to the compact design of the nose
Uncompromised accuracy and stability of analysis in varying environments
– also for low C, P, S, Sn, As and B concentrations in steel
Argon purged optics in the probe
Adapters for irregular surfaces available
Touch screen display on probe
Results immediately available for a quick check – no need to get
back to the main unit
Access to the main functions of the spectrometer – a true remote function
Virtual keyboard on a touch screen – labour-saving feature
Precise analysis and material identification including carbon,
phosphorus, sulphur, boron and tin determinations
Fast off-site, on-site and laboratory testing
Perfect mobility with long-life battery power and trolley for ergonomic use
Immediately ready for action with no warm-up phase
Easy to use, even for untrained operators
Lightweight ergonomic sample probe with 4 m flexible probe cable
Quick, simple touch-screen operation
Our unique Jet-Stream Technology ensures analysis accuracy on samples
of all sizes and shapes
Windows®-based software controlled with a rugged, dust-proof TFT
touch-screen even under the harshest conditions
Extensive and customisable grade library
Low maintenance costs
We are proud to introduce you a a new, unique, detachable probe to be
used with our PMI-MASTER PRO analyser.
With the new UVTouch you have all analysis information available on
the probe – and without any compromise in analytical precision or
elements to be determined.
Robust technology allows continuous use in any location, even in
rugged conditions
No more working with heavy items on ladders or scaffolds. Just take
the UVTouch probe and leave the spectrometer on the floor level!
This is the only analyser with an optional 10 m flexible connection
cable – ideal for difficult to reach areas.
To new extensions with the new OES UVTouch probe!!
Fast analysis, quick verification of results and sorting of material even on
remote, difficult and hard to reach areas in industrial yards – just
using the probe and its straightforward user interface
Long connection cable between the probe and main unit enables an
operation radius of 10 metres from the main PMI-MASTER PRO unit
User interface on a probe – optimal contrast properties to view any
lighting conditions inside and outside
Results displayed on both the probe and main unit thanks to an
automatic high-speed connection between the systems
Easy access to sample surfaces thanks to the compact design of the nose
Uncompromised accuracy and stability of analysis in varying environments
– also for low C, P, S, Sn, As and B concentrations in steel
Argon purged optics in the probe
Adapters for irregular surfaces available
Touch screen display on probe
Results immediately available for a quick check – no need to get
back to the main unit
Access to the main functions of the spectrometer – a true remote function
Virtual keyboard on a touch screen – labour-saving feature
Precise analysis and material identification including carbon,
phosphorus, sulphur, boron and tin determinations
Fast off-site, on-site and laboratory testing
Perfect mobility with long-life battery power and trolley for ergonomic use
Immediately ready for action with no warm-up phase
Easy to use, even for untrained operators
Lightweight ergonomic sample probe with 4 m flexible probe cable
Quick, simple touch-screen operation
Our unique Jet-Stream Technology ensures analysis accuracy on samples
of all sizes and shapes
Windows®-based software controlled with a rugged, dust-proof TFT
touch-screen even under the harshest conditions
Extensive and customisable grade library
Low maintenance costs
$
9,817.00
Oxford CMI95M thickness measurement
Oxford Instruments CMI95M is a battery operated handheld gauge for
measuring copper foil thickness on printed circuit board substrate
materials from 1/8 to 4.0 oz/ft2 (5-140µm) in less than a second.
The CMI95M is factory calibrated and requires no standards.
It is so easy to use – just touch the unique soft-touch probe to the
copper surface and note the thickness indication.
Avoid high scrap and rework costs
– identify out of spec copper foil thickness fast and accurately
A field proven, robust, simple to use and affordable handheld gauge
that sorts copper foil and
laminates by thickness
Eliminate board damage – the new CMI95M has an exclusive soft touch
probe to prevent the copper surface
from being marred or scratched
Proven durability and simple to use
Factory calibrated and requires no standards
Low battery warning
CE approved.
Specification :Dimensions : (W) 2.6” (66 mm) (D) 1.25” (32 mm) (H)
4.1” (104 mm)
Weight : 4.4 oz (125 grams)
Battery : 9 volt
Ranges : Oz/Ft2 1/8 1/4 3/8 1/2 1 2 3 4
µm 5 9 12 17 35 70 105 140
measuring copper foil thickness on printed circuit board substrate
materials from 1/8 to 4.0 oz/ft2 (5-140µm) in less than a second.
The CMI95M is factory calibrated and requires no standards.
It is so easy to use – just touch the unique soft-touch probe to the
copper surface and note the thickness indication.
Avoid high scrap and rework costs
– identify out of spec copper foil thickness fast and accurately
A field proven, robust, simple to use and affordable handheld gauge
that sorts copper foil and
laminates by thickness
Eliminate board damage – the new CMI95M has an exclusive soft touch
probe to prevent the copper surface
from being marred or scratched
Proven durability and simple to use
Factory calibrated and requires no standards
Low battery warning
CE approved.
Specification :Dimensions : (W) 2.6” (66 mm) (D) 1.25” (32 mm) (H)
4.1” (104 mm)
Weight : 4.4 oz (125 grams)
Battery : 9 volt
Ranges : Oz/Ft2 1/8 1/4 3/8 1/2 1 2 3 4
µm 5 9 12 17 35 70 105 140
$
215.00
Oxford CMI153 thickness measurement
applications:
Ideal metrology Solution for Coating Inspectors, Electroplating
Plants, Painting Contractors, Automotive & Aerospace Finishers
Measure non-conductive coatings over nonmagnetic conductive substrates
Paint & Powder Coats on Al, brass or Cu, Anodize on Al etc.
Measure nonmagnetic coatings over magnetic (ferrous) substrates:
Paint & Powder Coatings, Zn or Cd on Steel
Accurately quantify coating thickness after deposition
Features:
Magnetic Induction: Conforms to ASTM B499 & B530, DIN 50981, ISO 2178
and BS 5411 Parts 9 & 11
Eddy Current: Conforms to ASTM B244 & B259, DIN 50984, ISO 2360 and BS
5411 Part 3
Instrument is a is a single-button handheld device powered by a 9V battery.
Spectification:
Measurement Range: Ferrous Substrates, Magnetic Induction:
0.001-2.04mm (0.1–80mils)
Non-ferrous substrates, Eddy Current: 0.001-1.52mm (0.1–60mils)
Minimum ferrous and non-ferrous substrate thickness: 305µm, 12mils
Precision: Ferrous Substrates, Magnetic Induction: = 0.8µm
(0.03mils) for a 75µm (2.95mils) plastic standard on Steel
Non-Ferrous Substrates, Eddy Current: = 0.5µm (0.02mils) for a 75µm
(2.95mils) plastic standards on Aluminum
Resolution: 0.1 mils (2 µm )
Accuracy: ± (2µm + 3% of reading) or ± (0.1mils + 3% of reading)
Temperature range: Storage: -10°C to 60°C (14°F to 140° F)
Operation: 0° C to 60° C (32° F to 140° F)
Power Supply:
Battery: 2 x AA (Auto ON/OFF to extend Battery Life)
Dimensions: 3.75" x 2" x 1" (953mm x 508mm x 252mm)
Weight: 2.5 oz (71 g)
Ideal metrology Solution for Coating Inspectors, Electroplating
Plants, Painting Contractors, Automotive & Aerospace Finishers
Measure non-conductive coatings over nonmagnetic conductive substrates
Paint & Powder Coats on Al, brass or Cu, Anodize on Al etc.
Measure nonmagnetic coatings over magnetic (ferrous) substrates:
Paint & Powder Coatings, Zn or Cd on Steel
Accurately quantify coating thickness after deposition
Features:
Magnetic Induction: Conforms to ASTM B499 & B530, DIN 50981, ISO 2178
and BS 5411 Parts 9 & 11
Eddy Current: Conforms to ASTM B244 & B259, DIN 50984, ISO 2360 and BS
5411 Part 3
Instrument is a is a single-button handheld device powered by a 9V battery.
Spectification:
Measurement Range: Ferrous Substrates, Magnetic Induction:
0.001-2.04mm (0.1–80mils)
Non-ferrous substrates, Eddy Current: 0.001-1.52mm (0.1–60mils)
Minimum ferrous and non-ferrous substrate thickness: 305µm, 12mils
Precision: Ferrous Substrates, Magnetic Induction: = 0.8µm
(0.03mils) for a 75µm (2.95mils) plastic standard on Steel
Non-Ferrous Substrates, Eddy Current: = 0.5µm (0.02mils) for a 75µm
(2.95mils) plastic standards on Aluminum
Resolution: 0.1 mils (2 µm )
Accuracy: ± (2µm + 3% of reading) or ± (0.1mils + 3% of reading)
Temperature range: Storage: -10°C to 60°C (14°F to 140° F)
Operation: 0° C to 60° C (32° F to 140° F)
Power Supply:
Battery: 2 x AA (Auto ON/OFF to extend Battery Life)
Dimensions: 3.75" x 2" x 1" (953mm x 508mm x 252mm)
Weight: 2.5 oz (71 g)
$
250.00
Oxford Instruments CMI165 Copper Thickness Gauge with Temperature Compensation
The CMI165 provides unique temperature compensated Copper Thickness
Measurements in an ergonomic compact hand-held device. Measurements on
Copper are affected by the temperature of the measured sample. The CMI
165 accounts for temperature in the measurement of thickness ensuring
accurate in-process inspection results regardless of Copper
temperature. This versatile, portable gauge equipped with protective
case, has a rugged and durable design that allows it to be taken into
the harshest environments.
APPLICATIONS:
Measure hot or cold Cu on PCBs
Reduce waste by eliminating the need for coupons
Measure foil or laminated Cu thickness in µm, mils or oz
Sort Cu by weight at incoming drilling, shearing or plating
Quantify Cu thickness after etching or planarizing
Verify Cu plating thickness on PCB surfaces
FEATURES:
SRP-T1 Replaceable Probe Tip - no recalibration necessary
Spare SRP-T1 replacement tip ensures no factory downtime
Illuminated probe tip for easy positioning on copper traces
User Interface available in both English and Simplified Chinese
SPECIFICATIONS:
Copper thickness is measured using 4-point probe electrical resistance method
and conforms to standard EN 14571
Thickness measurement ranges:
Copper Electroless: (0.25-12.7) µm, (0.01-0.5) mils
Copper Electrodeposited: (2.0-254) µm, (0.1-10) mils
High repeatability and reliability: s= 0.08 µm at 20 µm (0.003 mils at
0.79 mils)
Statistical analysis includes data recording, average, standard
deviation and high-low reporting
Measurement units in µm, mils or oz
User interface in English or Simplified Chinese
Measure etched traces as thin as 204 µm (8mils) without line width standards
Store 9,690 measurements (with optional date and time stamp)
USB 2.0 high-speed data transfer interfaced with Microsoft Excel
Factory calibrated and certified by Oxford Instruments
Customizable for other applications
Static or continuous mode measurement
Powered by regular AA batteries
SUPPLIED WITH:
OICM CMI165 Copper Thickness Gauge
Spare SRP-T1 Replacement Probe Tip
OICM Protective carrying case with a belt clip
2 AAA alkaline batteries
OICM NIST Traceable Test Calibration Certificate
Quick Start Guide / Instruction manual
Measurements in an ergonomic compact hand-held device. Measurements on
Copper are affected by the temperature of the measured sample. The CMI
165 accounts for temperature in the measurement of thickness ensuring
accurate in-process inspection results regardless of Copper
temperature. This versatile, portable gauge equipped with protective
case, has a rugged and durable design that allows it to be taken into
the harshest environments.
APPLICATIONS:
Measure hot or cold Cu on PCBs
Reduce waste by eliminating the need for coupons
Measure foil or laminated Cu thickness in µm, mils or oz
Sort Cu by weight at incoming drilling, shearing or plating
Quantify Cu thickness after etching or planarizing
Verify Cu plating thickness on PCB surfaces
FEATURES:
SRP-T1 Replaceable Probe Tip - no recalibration necessary
Spare SRP-T1 replacement tip ensures no factory downtime
Illuminated probe tip for easy positioning on copper traces
User Interface available in both English and Simplified Chinese
SPECIFICATIONS:
Copper thickness is measured using 4-point probe electrical resistance method
and conforms to standard EN 14571
Thickness measurement ranges:
Copper Electroless: (0.25-12.7) µm, (0.01-0.5) mils
Copper Electrodeposited: (2.0-254) µm, (0.1-10) mils
High repeatability and reliability: s= 0.08 µm at 20 µm (0.003 mils at
0.79 mils)
Statistical analysis includes data recording, average, standard
deviation and high-low reporting
Measurement units in µm, mils or oz
User interface in English or Simplified Chinese
Measure etched traces as thin as 204 µm (8mils) without line width standards
Store 9,690 measurements (with optional date and time stamp)
USB 2.0 high-speed data transfer interfaced with Microsoft Excel
Factory calibrated and certified by Oxford Instruments
Customizable for other applications
Static or continuous mode measurement
Powered by regular AA batteries
SUPPLIED WITH:
OICM CMI165 Copper Thickness Gauge
Spare SRP-T1 Replacement Probe Tip
OICM Protective carrying case with a belt clip
2 AAA alkaline batteries
OICM NIST Traceable Test Calibration Certificate
Quick Start Guide / Instruction manual
$
831.00
Oxford CMI233 controlling of plating and paint & powder coating processes
The CMI233 package enables control of plating and paint & powder
coating processes using advanced magnetic induction and eddy-current
technology. It provides non-destructive coating thickness measurement
for non-magnetic coatings over magnetic (ferrous) substrates and
non-conductive coatings over conductive substrates (primarily Al, Cu
as close to 100% IACS conductivity is required). The system was
specially designed to handle the needs of platers, coaters, and
quality professionals.
Three versions of the CMI233 are available:
CMI233E: Instrument, ECP eddy current probe, protective case and set
of NIST traceable calibration shims
CMI233M: Instrument, SMP-2 magnetic induction probe, protective case
and set of NIST traceable calibration shims
CMI233Dual: Instrument, ECP eddy current and SMP-2 magnetic induction
probes, protective case and set of calibration shims.
aplicatiions:
Measure non-conductive coatings over nonmagnetic conductive
substrates, and conductive coatings on nonconductive substrates (Eddy
Current Probes)
Non-conductors on conductors, Paint & Powder Coats on Al, Anodize on Al etc.
Measure nonmagnetic coatings over magnetic (ferrous) substrates
(Magnetic Induction Probes)
Non-magnetic metals (Zn, Cd) on ferrous substrates, Paint & Powder
Coatings on Steel
Accurately quantify coating thickness after deposition
Features:
Magnetic Induction: Conforms to ASTM B499 & B530, DIN 50981, ISO 2178
and BS 5411 Parts 9 & 11
Eddy Current: Conforms to ASTM B244 & B259, DIN 50984, ISO 2360 and BS
5411 Part 3
Instrument is a is a 16-key handheld device powered by a 9V battery
Measurements can be taken in automatic or continuous modes
Scanning option compensates for uneven or textured substrate
materials, enhancing performance of gauge repeatability and
reproducibility
Memory capacity for over 12,000 readings accommodates high usage applications
Statistical data analysis, mean, standard deviation, high and low
reading, Histogram and Cpk available with printer or serial output
RS232 PC connectivity
coating processes using advanced magnetic induction and eddy-current
technology. It provides non-destructive coating thickness measurement
for non-magnetic coatings over magnetic (ferrous) substrates and
non-conductive coatings over conductive substrates (primarily Al, Cu
as close to 100% IACS conductivity is required). The system was
specially designed to handle the needs of platers, coaters, and
quality professionals.
Three versions of the CMI233 are available:
CMI233E: Instrument, ECP eddy current probe, protective case and set
of NIST traceable calibration shims
CMI233M: Instrument, SMP-2 magnetic induction probe, protective case
and set of NIST traceable calibration shims
CMI233Dual: Instrument, ECP eddy current and SMP-2 magnetic induction
probes, protective case and set of calibration shims.
aplicatiions:
Measure non-conductive coatings over nonmagnetic conductive
substrates, and conductive coatings on nonconductive substrates (Eddy
Current Probes)
Non-conductors on conductors, Paint & Powder Coats on Al, Anodize on Al etc.
Measure nonmagnetic coatings over magnetic (ferrous) substrates
(Magnetic Induction Probes)
Non-magnetic metals (Zn, Cd) on ferrous substrates, Paint & Powder
Coatings on Steel
Accurately quantify coating thickness after deposition
Features:
Magnetic Induction: Conforms to ASTM B499 & B530, DIN 50981, ISO 2178
and BS 5411 Parts 9 & 11
Eddy Current: Conforms to ASTM B244 & B259, DIN 50984, ISO 2360 and BS
5411 Part 3
Instrument is a is a 16-key handheld device powered by a 9V battery
Measurements can be taken in automatic or continuous modes
Scanning option compensates for uneven or textured substrate
materials, enhancing performance of gauge repeatability and
reproducibility
Memory capacity for over 12,000 readings accommodates high usage applications
Statistical data analysis, mean, standard deviation, high and low
reading, Histogram and Cpk available with printer or serial output
RS232 PC connectivity
$
650.00
Oxford CMI250 Ferrous and Non-ferrous Substrates and Structures
technology features magnetic induction and Eddy Current
measurement techniques with statistical analysis and PC interface. The
CMI250 is a feature rich instrument built upon our established Eddy
Current / Magnetic Induction dual probe technology.
The instrument offers factory and user calibrations, automatic
temperature compensation, base corrections, measurement storage
options, date and time stamping, statistical analysis, and USB PC
connectivity.
Useful in a wide variety of settings,
the CMI250 measures non-conductive coatings over non-ferrous
substrates and non-magnetic coatings over ferrous substrates.
applications:
deal Metrology Solution for:
Industrial Coatings and Painters
Appliance Coaters and Surface Finishers
Paint & Powder Coaters
Automotive & Aerospace Finishers
Coating Inspectors
Electroplating Plants
Painting Contractors
Features:
Store measurements, date and time stamp results, statistical analysis
of the coating thickness, deliver measurement results direct to your
PC
Eddy Current Technology for non-conductive coatings over non-ferrous
metals like aluminum, brass or copper:
Teflon, Enamel, Epoxy, Anodize, Paint & Powder Coats
Magnetic Induction Technology for non-magnetic coatings over steel or
ferrous substrates: Zinc, Cadmium, Paint & Powder Coats
measurement techniques with statistical analysis and PC interface. The
CMI250 is a feature rich instrument built upon our established Eddy
Current / Magnetic Induction dual probe technology.
The instrument offers factory and user calibrations, automatic
temperature compensation, base corrections, measurement storage
options, date and time stamping, statistical analysis, and USB PC
connectivity.
Useful in a wide variety of settings,
the CMI250 measures non-conductive coatings over non-ferrous
substrates and non-magnetic coatings over ferrous substrates.
applications:
deal Metrology Solution for:
Industrial Coatings and Painters
Appliance Coaters and Surface Finishers
Paint & Powder Coaters
Automotive & Aerospace Finishers
Coating Inspectors
Electroplating Plants
Painting Contractors
Features:
Store measurements, date and time stamp results, statistical analysis
of the coating thickness, deliver measurement results direct to your
PC
Eddy Current Technology for non-conductive coatings over non-ferrous
metals like aluminum, brass or copper:
Teflon, Enamel, Epoxy, Anodize, Paint & Powder Coats
Magnetic Induction Technology for non-magnetic coatings over steel or
ferrous substrates: Zinc, Cadmium, Paint & Powder Coats
$
415.00
Oxford CMI730
CMI-730Measure non-conductive coatings over nonmagnetic substrates,
metallic coatings on ferrous substrates and conductive coatings on
nonconductive substrates
Eddy Current Probes: Zn, Cd, Cr, Cu on Steel, Organic, Paint & Powder
Coats on Al, Anodize on Al etc.
Measure nonmagnetic coatings over magnetic substrates
Magnetic Induction Probes: Zn Ni, Cd, Cr, Cu, Organic, Paint & Powder,
etc. Coatings on Steel
Accurately quantify coating thickness after deposition
The CMI-730 package enables control of plating / coating processes
using advanced magnetic induction and eddy-current technology. The
CMI730 provides non-destructive coating / plating thickness
measurement for non-magnetic coatings over magnetic substrates,
non-conductive coatings over non-magnetic substrates and metallic
coatings on ferrous substrates.
Features:
High contrast color LCD display
Memory to store up to 5000 measurements, parameters and calibrations
RS232 PC connectivity
Parallel printer port
Multi-level user password security system
Statistical data analysis with histogram, X-bar, R-chart, trend charts
which can be viewed on the display or printed direct from the
instrument.
metallic coatings on ferrous substrates and conductive coatings on
nonconductive substrates
Eddy Current Probes: Zn, Cd, Cr, Cu on Steel, Organic, Paint & Powder
Coats on Al, Anodize on Al etc.
Measure nonmagnetic coatings over magnetic substrates
Magnetic Induction Probes: Zn Ni, Cd, Cr, Cu, Organic, Paint & Powder,
etc. Coatings on Steel
Accurately quantify coating thickness after deposition
The CMI-730 package enables control of plating / coating processes
using advanced magnetic induction and eddy-current technology. The
CMI730 provides non-destructive coating / plating thickness
measurement for non-magnetic coatings over magnetic substrates,
non-conductive coatings over non-magnetic substrates and metallic
coatings on ferrous substrates.
Features:
High contrast color LCD display
Memory to store up to 5000 measurements, parameters and calibrations
RS232 PC connectivity
Parallel printer port
Multi-level user password security system
Statistical data analysis with histogram, X-bar, R-chart, trend charts
which can be viewed on the display or printed direct from the
instrument.
$
1,432.00
Oxford X-MET7000 Handheld XRF Analysers
The X-MET7000 Series handheld XRF analyser is the flexible & easy to use tool of choice for elemental analysis in a wide range of industries
Based on the proven technique of energy dispersive X-ray fluorescence (EDXRF), the X-MET7000 Series is engineered for high performance and reliability, guaranteeing fast, non-destructive materials analysis at the press of a trigger.
The XRF analyser X-MET7000 Series comes with many great features:
Easy to use, minimal user training required: simple 'point and shoot' analysis
Icon-driven user interface with largest colour touch screen on the market: superior visibility in all weather conditions
Up to 10-12 hours battery life: operate a full day on a single battery charge
Simple, powerful and secure data download with total reporting flexibility, including wifi capability
Wide range of applications: scrap sorting, positive material identification (PMI), mine mapping, compliance testing, soil analysis, etc.
The X-MET combines more than 35 years of innovation in portable XRF. Minimising the need for expensive and time consuming laboratory analysis, the handheld XRF analyser X-MET7000 Series delivers accurate, fast and totally non-destructive XRF analysis.
Large, icon driven touch screen user interface for ease of use
Intuitive and easy-to-read graphical user interface screen (4.3") ensures ease-of-use and maximum productivity
The X-MET's large icons are easy to select, even with gloves on
Bright and high contrast Blanview® transmissive LCD touch screen ensures optimal viewing even in direct sunlight
Result screen can easily be user customised for individual needs. Show only the elements of interest or create pass/fail messages
Enhanced data download reporting flexibility
Store up to 100, 000 results including spectra
Create customised analysis reports with new Report Generator software
Secure pdf format for ultimate data security - no possibility to tamper with the results
Download results, spectra or reports directly onto USB memory stick (no need to carry laptop to export data), or onto a PC/laptop/tablet, using USB connection or WiFi
User interface and report generator available in 13 languages
Built to last
Built to withstand the harshest environments and weather conditions
High impact resistant housing with environmental sealing
IP54 compliant (equivalent to NEMA 3): Superior protection against dust and water
Up to 10-12 hours battery life: operate for more than a full day on a single battery charge
Protective rubber bumpers protects the screen, sides of the analyser nose and the battery and prevent slipping to ground
From extreme heat to freezing cold, in a dusty environment and direct sunlight, the X-MET always delivers the highest levels of performance
Largest grade library available on the market
Integrated extensive grade library (more than 1,600) ensures the display of the correct grade
Add and modify grades according to your needs
Select and switch grade library if and when required (AISI, DIN, JIS, ... available)
Rapid and accurate analysis
Correct gradings in seconds
Unbeatable performance and flexibility with Fundamental Parameters and/or Empirical calibration
High speed averaging for effortless batch evaluation
User-defined Pass / Fail messages for fast sorting and screening
Low limits of detection
Based on the proven technique of energy dispersive X-ray fluorescence (EDXRF), the X-MET7000 Series is engineered for high performance and reliability, guaranteeing fast, non-destructive materials analysis at the press of a trigger.
The XRF analyser X-MET7000 Series comes with many great features:
Easy to use, minimal user training required: simple 'point and shoot' analysis
Icon-driven user interface with largest colour touch screen on the market: superior visibility in all weather conditions
Up to 10-12 hours battery life: operate a full day on a single battery charge
Simple, powerful and secure data download with total reporting flexibility, including wifi capability
Wide range of applications: scrap sorting, positive material identification (PMI), mine mapping, compliance testing, soil analysis, etc.
The X-MET combines more than 35 years of innovation in portable XRF. Minimising the need for expensive and time consuming laboratory analysis, the handheld XRF analyser X-MET7000 Series delivers accurate, fast and totally non-destructive XRF analysis.
Large, icon driven touch screen user interface for ease of use
Intuitive and easy-to-read graphical user interface screen (4.3") ensures ease-of-use and maximum productivity
The X-MET's large icons are easy to select, even with gloves on
Bright and high contrast Blanview® transmissive LCD touch screen ensures optimal viewing even in direct sunlight
Result screen can easily be user customised for individual needs. Show only the elements of interest or create pass/fail messages
Enhanced data download reporting flexibility
Store up to 100, 000 results including spectra
Create customised analysis reports with new Report Generator software
Secure pdf format for ultimate data security - no possibility to tamper with the results
Download results, spectra or reports directly onto USB memory stick (no need to carry laptop to export data), or onto a PC/laptop/tablet, using USB connection or WiFi
User interface and report generator available in 13 languages
Built to last
Built to withstand the harshest environments and weather conditions
High impact resistant housing with environmental sealing
IP54 compliant (equivalent to NEMA 3): Superior protection against dust and water
Up to 10-12 hours battery life: operate for more than a full day on a single battery charge
Protective rubber bumpers protects the screen, sides of the analyser nose and the battery and prevent slipping to ground
From extreme heat to freezing cold, in a dusty environment and direct sunlight, the X-MET always delivers the highest levels of performance
Largest grade library available on the market
Integrated extensive grade library (more than 1,600) ensures the display of the correct grade
Add and modify grades according to your needs
Select and switch grade library if and when required (AISI, DIN, JIS, ... available)
Rapid and accurate analysis
Correct gradings in seconds
Unbeatable performance and flexibility with Fundamental Parameters and/or Empirical calibration
High speed averaging for effortless batch evaluation
User-defined Pass / Fail messages for fast sorting and screening
Low limits of detection
$
7,980.00
Oxford X-MET7500 Scrap Metal Analyzer
The X-MET7500 Scrap Metal Analyzer is an invaluable tool at the scrap yard to sort scrap, from stainless steel to aluminium alloys. The Scrap Metal Analyzer enables you to quickly and reliably identify scrap metal and determine its value, thus maximising your profits.
Reliable identification of scrap metal for on-the-spot sorting and valuation
Field-proven ‘point and shoot’ analysis
Correct grading in seconds
Analyse the widest variety of alloys, including magnesium and aluminium alloys
User-defined Pass/Fail messages for fastest sorting
High speed averaging for effortless batch evaluation
Fast start up: ready to analyse in just a few seconds
Results you can trust through a combination of empirical and fundamental parameters calibrations
Extensive grade libraries (AISI, DIN, JIS…)
Analysis of samples of all sizes and shapes, from large parts to wires, strips, pipes, cables
The Scrap Metal Analyzer comes with up to 12 hours battery life, rugged design, great ergonomics and is easy to use for maximum productivity at the scrap yard.
Contact us for more information and to arrange a demonstration of the X-MET7500 Scrap Metal Analyzer
The new X-MET handheld XRF analyser is an invaluable tool at the scrap yard. Sort scrap from stainless steel to aluminium alloys, from plastics to wood and electronics. Get rapid and accurate grade analysis to work out value of scrap metal and maximise profits.
The X-MET7500 Scrap Metal Analyser combines trusted and proven point-and-shoot simplicity with powerful results
Suitable for sorting alloys as well as for screening unwanted or hazardous elements at low levels
Quick identification of close grades such as 304/321
Grade aluminium alloys based on heavy element content
Accurate at low level concentrates of Ni, Mo and Cu
Whether you analyse large or small samples, solids and chips, turnings or shavings - form or size of the sample does not matter. The X-MET automatically compensates for a wide variety of shapes and forms providing superb accuracy even on the most uneven surfaces.
Automatic high speed averaging is available for effortless batch evaluation
Analyses elements from Cl to U
The NEW X-MET7000 Series handheld analyser is based on extensive customer feedback and offers many improvements, providing rugged on-site analysis in the world’s most challenging environments.
Built to withstand the harshest environments and weather conditions
High impact resistant plastic housing with environmental sealing
IP54 compliant (equivalent to NEMA 3). Superior protection against dust
and water
NEW user interface screen on the X-MET ensures ease-of-use and maximum productivity
New icon driven touch screen user interface
Clear, intuitive functional icons for ease of use
The X-MET's large icons are easy to select, even with gloves on
Large grade display with closest match information
See your analysis results more clearly on the largest screen on the market (4,3")
Bright, high contrast and advanced Blanview® LCD touch screen for optimal viewing even in direct sunlight
The result screen can easily be user customised for individual needs to show only the elements of interest or create pass/fail messages
The X-MET's user interface available in 13 languages (English, Chinese traditional and simplified, Korean, Russian, Japanese, Spanish, French, German, Polish, Portuguese, Italian and Finnish)
NEW simple data connectivity and export software package!
The X-MET is capable of storing up to 100 000 results including the spectra
Download results, spectra or reports onto USB memory stick: no need to carry laptop to export data
Create customised analysis reports with new Report Generator software
The X-MET remote software runs in a web browser window so no special software installations are required
Secured pdf format for ultimate data security - no possibility to tamper with the results!
Advanced data transfer options and reporting software are all included as standard
Reliable identification of scrap metal for on-the-spot sorting and valuation
Field-proven ‘point and shoot’ analysis
Correct grading in seconds
Analyse the widest variety of alloys, including magnesium and aluminium alloys
User-defined Pass/Fail messages for fastest sorting
High speed averaging for effortless batch evaluation
Fast start up: ready to analyse in just a few seconds
Results you can trust through a combination of empirical and fundamental parameters calibrations
Extensive grade libraries (AISI, DIN, JIS…)
Analysis of samples of all sizes and shapes, from large parts to wires, strips, pipes, cables
The Scrap Metal Analyzer comes with up to 12 hours battery life, rugged design, great ergonomics and is easy to use for maximum productivity at the scrap yard.
Contact us for more information and to arrange a demonstration of the X-MET7500 Scrap Metal Analyzer
The new X-MET handheld XRF analyser is an invaluable tool at the scrap yard. Sort scrap from stainless steel to aluminium alloys, from plastics to wood and electronics. Get rapid and accurate grade analysis to work out value of scrap metal and maximise profits.
The X-MET7500 Scrap Metal Analyser combines trusted and proven point-and-shoot simplicity with powerful results
Suitable for sorting alloys as well as for screening unwanted or hazardous elements at low levels
Quick identification of close grades such as 304/321
Grade aluminium alloys based on heavy element content
Accurate at low level concentrates of Ni, Mo and Cu
Whether you analyse large or small samples, solids and chips, turnings or shavings - form or size of the sample does not matter. The X-MET automatically compensates for a wide variety of shapes and forms providing superb accuracy even on the most uneven surfaces.
Automatic high speed averaging is available for effortless batch evaluation
Analyses elements from Cl to U
The NEW X-MET7000 Series handheld analyser is based on extensive customer feedback and offers many improvements, providing rugged on-site analysis in the world’s most challenging environments.
Built to withstand the harshest environments and weather conditions
High impact resistant plastic housing with environmental sealing
IP54 compliant (equivalent to NEMA 3). Superior protection against dust
and water
NEW user interface screen on the X-MET ensures ease-of-use and maximum productivity
New icon driven touch screen user interface
Clear, intuitive functional icons for ease of use
The X-MET's large icons are easy to select, even with gloves on
Large grade display with closest match information
See your analysis results more clearly on the largest screen on the market (4,3")
Bright, high contrast and advanced Blanview® LCD touch screen for optimal viewing even in direct sunlight
The result screen can easily be user customised for individual needs to show only the elements of interest or create pass/fail messages
The X-MET's user interface available in 13 languages (English, Chinese traditional and simplified, Korean, Russian, Japanese, Spanish, French, German, Polish, Portuguese, Italian and Finnish)
NEW simple data connectivity and export software package!
The X-MET is capable of storing up to 100 000 results including the spectra
Download results, spectra or reports onto USB memory stick: no need to carry laptop to export data
Create customised analysis reports with new Report Generator software
The X-MET remote software runs in a web browser window so no special software installations are required
Secured pdf format for ultimate data security - no possibility to tamper with the results!
Advanced data transfer options and reporting software are all included as standard
$
8,167.00
Oxford AffirmoEX benchtop EMR Spectrometer
Oxford Instruments supplies the world’s smallest Benchtop Electron Magnetic Resonance (EMR) spectrometer for industrial, scientific and educational applications.
Electron Magnetic Resonance (EMR), also known as Electron Spin Resonance (ESR) or Electron Paramagnetic Resonance (EPR), is a long established technique that offers direct measurement of free radicals (unpaired electrons) and a range of valence states in transition metals. Until now the instrumentation available has confined the technique to advanced research applications and expert users.
With the introduction of Oxford Instruments’ new AffirmoEX, this technique is now accessible for development and Quality Assurance applications in industrial and educational laboratories where it can be used as a tool to find answers to practical problems without needing an in-house EMR expert.
The AffirmoEX includes a patented miniature electron spin resonance spectrometer, operating at 9.7 GHz with a sweep range of up to 400 mT providing sub-micromolar sensitivity. It is supplied with an automatic temperature controller and integrated full Windows computer system with Ethernet and multiple USB ports.
Features
Improved control of frying processes
Reduced cost of cooking oil replenishment
Improved quality control of oil-cooked products
Improved machinery lifetime
Cost-optimised lubricating oil replacement
Early identification of incipient machinery failure
Affordable, practical student hands-on experience
Direct Measurements
Spin-trap measurements
Spin-label measurements
Electron Magnetic Resonance (EMR), also known as Electron Spin Resonance (ESR) or Electron Paramagnetic Resonance (EPR), is a long established technique that offers direct measurement of free radicals (unpaired electrons) and a range of valence states in transition metals. Until now the instrumentation available has confined the technique to advanced research applications and expert users.
With the introduction of Oxford Instruments’ new AffirmoEX, this technique is now accessible for development and Quality Assurance applications in industrial and educational laboratories where it can be used as a tool to find answers to practical problems without needing an in-house EMR expert.
The AffirmoEX includes a patented miniature electron spin resonance spectrometer, operating at 9.7 GHz with a sweep range of up to 400 mT providing sub-micromolar sensitivity. It is supplied with an automatic temperature controller and integrated full Windows computer system with Ethernet and multiple USB ports.
Features
Improved control of frying processes
Reduced cost of cooking oil replenishment
Improved quality control of oil-cooked products
Improved machinery lifetime
Cost-optimised lubricating oil replacement
Early identification of incipient machinery failure
Affordable, practical student hands-on experience
Direct Measurements
Spin-trap measurements
Spin-label measurements
$
3,615.00
Oxford X-MET5100 Hand-held XRF analyzer
X-MET5100 for Metal and Alloy Analysis
QC
PMI
Scrap Sorting
FACRoHS
Oxford Instruments new X-MET5100 takes the analytical performance of
hand-held XRF to a completely new level. X-MET5100 combines Oxford
Instruments ground-breaking Silicon Drift Detector (SDD) with a
powerful 45kV X-ray tube.
This cutting edge technology delivers fast, highly accurate
measurement and the lowest limits of detection, enabling the analysis
of Light Elements such as Mg, Al and Si without the need for complex
vacuum or helium attachments. A truly huge step forward for hand-held
X-ray fluorescence analysis.
Key Features:
Revolutionary Light Element analysis, no awkward vacuum
pumps or helium bottles
Substantially faster analysis and throughput
Low detection limits: ppm level analysis in 10 seconds
Totally non-destructive testing
Traceable Empirical Calibration to certified reference materials
Fast and reliable identification of wide range of grades
Withstand temperatures up to 400ºC / 750ºF
Analyze weld beams down to 2 mm with optional weld beam collimator
QC
PMI
Scrap Sorting
FACRoHS
Oxford Instruments new X-MET5100 takes the analytical performance of
hand-held XRF to a completely new level. X-MET5100 combines Oxford
Instruments ground-breaking Silicon Drift Detector (SDD) with a
powerful 45kV X-ray tube.
This cutting edge technology delivers fast, highly accurate
measurement and the lowest limits of detection, enabling the analysis
of Light Elements such as Mg, Al and Si without the need for complex
vacuum or helium attachments. A truly huge step forward for hand-held
X-ray fluorescence analysis.
Key Features:
Revolutionary Light Element analysis, no awkward vacuum
pumps or helium bottles
Substantially faster analysis and throughput
Low detection limits: ppm level analysis in 10 seconds
Totally non-destructive testing
Traceable Empirical Calibration to certified reference materials
Fast and reliable identification of wide range of grades
Withstand temperatures up to 400ºC / 750ºF
Analyze weld beams down to 2 mm with optional weld beam collimator
$
7,130.00