FISCHERSCOPE X-RAY XUL series
Description:
The FISCHERSCOPE XUL, is designed with the X-Ray tube and the detector system located underneath the measuring stage. This results in a bottom to top measurement direction. It offers significant advantages, especially for measuring small components with varying geometry such as screws, nuts, bolts, or various types of electrical contacts. In most cases, the surface area to be tested can be placed directly on the measuring stage. This avoids the adjustment of the measurement distance otherwise required with top to bottom measurement systems. The measurement spot is automatically at the correct distance. This speeds up the measurement process and avoids possible measurement errors as a result of a poor part positioning. - FISCHER is the only manufacturer of X-Ray fluorescence coating thickness measuring instruments to incorporate this practical design.
In combination with the software WinFTM V.6 and the application kit Gold Assay, the XUL is also part of the FISCHERSCOPE® GOLDLINE ASSAY, ideally suited for the fast, non-destructive and accurate gold content measurement in jewelry and precious metals.
The FISCHERSCOPE XUL, is designed with the X-Ray tube and the detector system located underneath the measuring stage. This results in a bottom to top measurement direction. It offers significant advantages, especially for measuring small components with varying geometry such as screws, nuts, bolts, or various types of electrical contacts. In most cases, the surface area to be tested can be placed directly on the measuring stage. This avoids the adjustment of the measurement distance otherwise required with top to bottom measurement systems. The measurement spot is automatically at the correct distance. This speeds up the measurement process and avoids possible measurement errors as a result of a poor part positioning. - FISCHER is the only manufacturer of X-Ray fluorescence coating thickness measuring instruments to incorporate this practical design.
In combination with the software WinFTM V.6 and the application kit Gold Assay, the XUL is also part of the FISCHERSCOPE® GOLDLINE ASSAY, ideally suited for the fast, non-destructive and accurate gold content measurement in jewelry and precious metals.
$
6,290.00
FISCHERSCOPE X-RAY XDL
Description:
The FISCHERSCOPE X-RAY XDL instruments are universally applicable energy dispersive x-ray spectrometers. They represent the next step in the development of the proven FISCHERSCOPE X-RAY XDL-B model series. Like their predecessors, they are particularly well suited for non-destructive thickness measurements and analysis of thin coatings, for measurements on mass-produced parts and pc-boards as well as for the solution analysis.
A high count rate is achieved by using a proportional counter tube, which allows for precise measurements. Using the Fischer fundamental parameter method, coating systems as well as solid and liquid samples can be analyzed standard-free. It is possible to detect up to 24 elements in the range from chlorine (17) to uranium (92) simultaneously.
The XDL x-ray spectrometers have an excellent long-term stability, which among other things is reflected in a significantly reduced calibration effort. The instruments of the XDL® series are especially well suited for measurements in quality assurance, reception inspection and production monitoring.
Typical areas of application are:
Measurement of electro-plated mass-produced parts
Inspection of thin coatings, e.g., decorative chromium-plating
Analysis of functional coatings in the electronics and semiconductor industries
Automated measurements, e.g., on pc-boards
Solution analysis in the electroplating
The FISCHERSCOPE X-RAY XDL instruments are universally applicable energy dispersive x-ray spectrometers. They represent the next step in the development of the proven FISCHERSCOPE X-RAY XDL-B model series. Like their predecessors, they are particularly well suited for non-destructive thickness measurements and analysis of thin coatings, for measurements on mass-produced parts and pc-boards as well as for the solution analysis.
A high count rate is achieved by using a proportional counter tube, which allows for precise measurements. Using the Fischer fundamental parameter method, coating systems as well as solid and liquid samples can be analyzed standard-free. It is possible to detect up to 24 elements in the range from chlorine (17) to uranium (92) simultaneously.
The XDL x-ray spectrometers have an excellent long-term stability, which among other things is reflected in a significantly reduced calibration effort. The instruments of the XDL® series are especially well suited for measurements in quality assurance, reception inspection and production monitoring.
Typical areas of application are:
Measurement of electro-plated mass-produced parts
Inspection of thin coatings, e.g., decorative chromium-plating
Analysis of functional coatings in the electronics and semiconductor industries
Automated measurements, e.g., on pc-boards
Solution analysis in the electroplating
$
8,755.00
FISCHERSCOPE X-RAY 5000
The FISCHERSCOPE X-RAY 5000 instruments are innovative energy dispersive x-ray fluorescence spectrometers (EDXRF) for in-line applications in industrial production sites. They fulfill DIN ISO 3497 and ASTM B 568.
These instruments are specially designed for continuous non-destructive analysis and measurement of thin layers and layer systems in production processes. For industrial demands and maintenance free continuous operation, the design is robust and without any moving parts.
The FISCHERSCOPE X-RAY 5000 measures and analyzes layers and layer systems
- in the photo voltaic industry, i.e. CIGS, CIS, CdTe
- foils and belts
- alloys and coatings
- under ambient temperature or on very hot surfaces (up to 500°C / 932 F)
- in continuous operation and under industrial conditions
The FISCHERSCOPE X-RAY 5000 measures in a vacuum or ambient air. With its powerful semiconductor detectors, it can determine elements in the range of sodium to uranium.
For easy integration into production lines they come with a standardized mounting flange. Various modular build versions are available.
These instruments are specially designed for continuous non-destructive analysis and measurement of thin layers and layer systems in production processes. For industrial demands and maintenance free continuous operation, the design is robust and without any moving parts.
The FISCHERSCOPE X-RAY 5000 measures and analyzes layers and layer systems
- in the photo voltaic industry, i.e. CIGS, CIS, CdTe
- foils and belts
- alloys and coatings
- under ambient temperature or on very hot surfaces (up to 500°C / 932 F)
- in continuous operation and under industrial conditions
The FISCHERSCOPE X-RAY 5000 measures in a vacuum or ambient air. With its powerful semiconductor detectors, it can determine elements in the range of sodium to uranium.
For easy integration into production lines they come with a standardized mounting flange. Various modular build versions are available.
$
4,250.00
FISCHERSCOPE X-RAY XDV SDD
The FISCHERSCOPE-X-RAY XDV®-SDD is a universally applicable energy dispersive x-ray spectrometer. It is particularly well suited for the non-destructive analysis of very thin coatings, for small concentrations trace analysis and for automated measurements.
Typical areas of application are:
- Analysis of thin or very thin coatings,e.g., gold/palladium coatings of =0.1 µm
- Trace analysis on pc boards according to RoHS and WEEE requirements
- Gold and precious metals analysis
- Measurement of functional coatings in the electronics and semiconductor industries
- Determination of complex multi-coating systems
- Automated measurements, e.g., in quality control
To create ideal excitation conditions for every measurement, the XDV-SDD features electrically changeable apertures and primary filters. The modern silicon drift detector achieves high analysis accuracy and good detection sensitivity. Due to large apertures (collimators) and a very fast pulse processor, it is ideally suited for capturing high count rates.
The XDV-SDD x-ray spectrometer has an excellent long-term stability, which is reflected in a significantly reduced calibration effort, among other things. Using the fundamental parameter method, coating systems as well as solid and liquid samples can be analyzed standard-free. It is possible to detect up to 24 elements in a range from aluminum (13) to uranium (92) simultaneously.
With its fast, programmable X/Y-stage, it is the fitting measuring instrument for automated sample measurements.
Typical areas of application are:
- Analysis of thin or very thin coatings,e.g., gold/palladium coatings of =0.1 µm
- Trace analysis on pc boards according to RoHS and WEEE requirements
- Gold and precious metals analysis
- Measurement of functional coatings in the electronics and semiconductor industries
- Determination of complex multi-coating systems
- Automated measurements, e.g., in quality control
To create ideal excitation conditions for every measurement, the XDV-SDD features electrically changeable apertures and primary filters. The modern silicon drift detector achieves high analysis accuracy and good detection sensitivity. Due to large apertures (collimators) and a very fast pulse processor, it is ideally suited for capturing high count rates.
The XDV-SDD x-ray spectrometer has an excellent long-term stability, which is reflected in a significantly reduced calibration effort, among other things. Using the fundamental parameter method, coating systems as well as solid and liquid samples can be analyzed standard-free. It is possible to detect up to 24 elements in a range from aluminum (13) to uranium (92) simultaneously.
With its fast, programmable X/Y-stage, it is the fitting measuring instrument for automated sample measurements.
$
6,298.00
FISCHERSCOPE X-Ray XAN 120
FISCHERSCOPE X-Ray XAN 120 is a modern tabletop x-ray spectrometer (EDXRF). It is optimized for fast, non-destructive analysis of jewelry, precious metals in general, yellow and white gold, platinum and silver, rhodium, coins and all jewelry alloys and coatings.
The XAN® 120 is accurate, safe and easy to use, robust and maintenance free. In addition, it meets the requirements of DIN ISO 3497 and ASTM B 568. The high-resolution silicon-PIN-detector combined with a fast signal processing achieves extreme precision and very low detection limits. In a matter of seconds, all elements in the range of Chlorine (17) to Uranium (92) are determined accurately.
Whether you want to measure known samples or determine unknown materials, the XAN® 120 with the exceptional Fischer WinFTM® operating software is the right choice.
Either using the new and improved fundamental parameter standardless method or standards based – the result is always fast and exact. To simplify sample placement, the x-ray source and the high resolution silicon-PIN-detector are arranged in the base of the XAN® 120 which uses an upwards measurement technique.
The integrated video-microscope with cross hair, beam indicator, spot illumination and magnification make sample placement and spot determination quick and easy. There is no need to adjust a table or sample stage – just place and measure.
Long-term stability and outstanding precision – better than 1‰ for gold – are benefits of the XAN® 120. In addition, the necessity for re-calibration is significantly reduced thus saving time, effort and cost of ownership. Measured results are displayed in karat, ‰ or weight %, and easily printed out as customized reports.
Excellent ergonomics, easy operation and fast calculation of the measurement best describe the XAN® 120 . Usage is safe and easy – for experienced staff as well as for employees with little training. There is no need for a special laboratory room for the XAN® 120. If you need an outstanding, accurate and reliable tool– the XAN® 120 is the right choice.
WinFTM Evaluation Software for PC
The advanced Fischer WinFTM software comes all inclusive – complete, easy to use and without any need for additional modules or upgrades. It includes:
Operation of the x-ray unit
Control of the entire measuring process
Advanced fundamental parameter method for standard- free measurements
Standard based measurements, calibration with certified standards
Material analysis of composition and coating thickness
Automatic element peak identification
Indication of values as karat, wt% or ‰
Reporting tool for customized reports
The XAN® 120 is accurate, safe and easy to use, robust and maintenance free. In addition, it meets the requirements of DIN ISO 3497 and ASTM B 568. The high-resolution silicon-PIN-detector combined with a fast signal processing achieves extreme precision and very low detection limits. In a matter of seconds, all elements in the range of Chlorine (17) to Uranium (92) are determined accurately.
Whether you want to measure known samples or determine unknown materials, the XAN® 120 with the exceptional Fischer WinFTM® operating software is the right choice.
Either using the new and improved fundamental parameter standardless method or standards based – the result is always fast and exact. To simplify sample placement, the x-ray source and the high resolution silicon-PIN-detector are arranged in the base of the XAN® 120 which uses an upwards measurement technique.
The integrated video-microscope with cross hair, beam indicator, spot illumination and magnification make sample placement and spot determination quick and easy. There is no need to adjust a table or sample stage – just place and measure.
Long-term stability and outstanding precision – better than 1‰ for gold – are benefits of the XAN® 120. In addition, the necessity for re-calibration is significantly reduced thus saving time, effort and cost of ownership. Measured results are displayed in karat, ‰ or weight %, and easily printed out as customized reports.
Excellent ergonomics, easy operation and fast calculation of the measurement best describe the XAN® 120 . Usage is safe and easy – for experienced staff as well as for employees with little training. There is no need for a special laboratory room for the XAN® 120. If you need an outstanding, accurate and reliable tool– the XAN® 120 is the right choice.
WinFTM Evaluation Software for PC
The advanced Fischer WinFTM software comes all inclusive – complete, easy to use and without any need for additional modules or upgrades. It includes:
Operation of the x-ray unit
Control of the entire measuring process
Advanced fundamental parameter method for standard- free measurements
Standard based measurements, calibration with certified standards
Material analysis of composition and coating thickness
Automatic element peak identification
Indication of values as karat, wt% or ‰
Reporting tool for customized reports
$
6,750.00
FISCHERSCOPE X-RAY XDVM u (SD)
The FISCHERSCOPE® X-RAY XDVM µ (SD) is used for the analysis of coating systems on microstructures. Due to its novel, patented mirror X-ray optics, this instrument can generate very small measurement spots of only about 20 µm x 50 µm in size with very high radiation intensities.
Contrary to the purely µ-design version, the XDVM®-µ-SD version does not use a proportional counter tube as a detector but instead a Si PIN diode. (SD means Solid State Detector). This high-quality semiconductor detector does not require cooling with liquid nitrogen and still enables a very high energy resolution. The SD design is, therefore, predestined for the analysis of completely unknown samples.
Thus, this instrument is suited for quality control of miniaturized pc-boards, chips or contacts. Measurements are possible on structures that are only a few 10 micrometers wide.
Because of this new X-ray optics, the X-RAY XDVM®-µ-SD is capable of analyzing coating systems on very thin structures for thickness and composition, even in areas where conventional X-ray fluorescence instruments have to pass, due to insufficient radiation intensity.
The WinFTM® V.6 Software allows for the analysis of multi-coating systems with up to 24 individual layers or of alloys with up to 24 different elements .
Please note:
The version XDVM-µ-SD-C is for applications, where a small measuring spot as well as a high x-ray intensity is needed.
The x-ray optics consists of a polycapillary system which is focussing the primary x-ray beam on the measuring spot of the sample.
Contrary to the purely µ-design version, the XDVM®-µ-SD version does not use a proportional counter tube as a detector but instead a Si PIN diode. (SD means Solid State Detector). This high-quality semiconductor detector does not require cooling with liquid nitrogen and still enables a very high energy resolution. The SD design is, therefore, predestined for the analysis of completely unknown samples.
Thus, this instrument is suited for quality control of miniaturized pc-boards, chips or contacts. Measurements are possible on structures that are only a few 10 micrometers wide.
Because of this new X-ray optics, the X-RAY XDVM®-µ-SD is capable of analyzing coating systems on very thin structures for thickness and composition, even in areas where conventional X-ray fluorescence instruments have to pass, due to insufficient radiation intensity.
The WinFTM® V.6 Software allows for the analysis of multi-coating systems with up to 24 individual layers or of alloys with up to 24 different elements .
Please note:
The version XDVM-µ-SD-C is for applications, where a small measuring spot as well as a high x-ray intensity is needed.
The x-ray optics consists of a polycapillary system which is focussing the primary x-ray beam on the measuring spot of the sample.
$
7,324.00
FISCHERSCOPE X-RAY 4000
Hardware Features:
The FISCHERSCOPE® X-RAY 4000 measures continuously rolling material strips in a contact-free way. The material range comprises even or punched strips, mainly when the strip material shows a formed or embossed surface.
Coating thickness and material analysis of practically all metallic layer systems can be performed in one run. The well-designed measuring head is flexible and robust. The protection hood can be removed easiliy and is equipped with a double-acting security device. The strip guidance can be set easiliy and quickly. It allows for precise and very quick positioning of the specimen, because of the high-resolution color video camera.
The FISCHERSCOPE® X-RAY 4000 measures continuously rolling material strips in a contact-free way. The material range comprises even or punched strips, mainly when the strip material shows a formed or embossed surface.
Coating thickness and material analysis of practically all metallic layer systems can be performed in one run. The well-designed measuring head is flexible and robust. The protection hood can be removed easiliy and is equipped with a double-acting security device. The strip guidance can be set easiliy and quickly. It allows for precise and very quick positioning of the specimen, because of the high-resolution color video camera.
$
3,675.00
FISCHERSCOPE X-Ray XAN 150
The XAN® 150 is especially well suited for measuring and analyzing thin coatings, even with very complex compositions or small concentrations.
Typical areas of application are:
Measurement of functional coatings, starting from a few nanometers, in the electronics and semiconductor industries
Trace analysis for consumer protection, e.g. lead content in toys
Analysis of alloys with highest requirements of accuracy in the jewelry and watch industries and in metal refineries
Research in universities and in the industries
Using the fundamental parameter method, coating systems as well as solid and liquid samples can be analyzed standard-free. It is possible to detect up to 24 elements in a range from aluminum (13) to uranium (92) simultaneously. The instrument has an excellent accuracy and long-term stability, which among other things is reflected in a significantly reduced calibration effort.
For high accuracy tasks, calibrations can be performed at any time. Excellent ergonomics, easy operation, fast calculation and data presentation are all features of the instrument.
To create ideal excitation conditions for every measurement, the XAN® 150 features electrically changeable apertures and primary filters. The modern silicon drift detector achieves high accuracy and good detection sensitivity.
Typical areas of application are:
Measurement of functional coatings, starting from a few nanometers, in the electronics and semiconductor industries
Trace analysis for consumer protection, e.g. lead content in toys
Analysis of alloys with highest requirements of accuracy in the jewelry and watch industries and in metal refineries
Research in universities and in the industries
Using the fundamental parameter method, coating systems as well as solid and liquid samples can be analyzed standard-free. It is possible to detect up to 24 elements in a range from aluminum (13) to uranium (92) simultaneously. The instrument has an excellent accuracy and long-term stability, which among other things is reflected in a significantly reduced calibration effort.
For high accuracy tasks, calibrations can be performed at any time. Excellent ergonomics, easy operation, fast calculation and data presentation are all features of the instrument.
To create ideal excitation conditions for every measurement, the XAN® 150 features electrically changeable apertures and primary filters. The modern silicon drift detector achieves high accuracy and good detection sensitivity.
$
8,990.00
FISCHERSCOPE X-Ray XUV® 773
The XUV 773 is designed for thin layer measurement and analysis in general. Therefore it is dedicated for research, quality control and optimization of production processes. Typical applications are:
Thin coatings like CIGS, CIS, CdTe
Coatings and analysis in electronic and semiconductor industries
Gold, jewelry and gem stone analysis, without alteration of the sample
Analysis of traces, RoHS, WEEE
Thin coatings like CIGS, CIS, CdTe
Coatings and analysis in electronic and semiconductor industries
Gold, jewelry and gem stone analysis, without alteration of the sample
Analysis of traces, RoHS, WEEE
$
7,543.00
FISCHERSCOPE X-RAY XDAL
Description:
The XDAL instruments with silicon PIN detectors provide reliable analysis results and coating thickness readings even with small concentrations and very thin coatings. With their fast and highly precise XY(Z) measuring stage, they are ideally suited for automated sample measurements.
Typical areas of application are:
Analysis of very thin coatings, e.g. gold and palladium coatings of = 0.1 µm
Measurement of functional coatings in the electronics and semiconductor industries
Determination of complex multi-coating systems
Automated measurements, e.g. in quality control
Determination of the lead content in solder
The XDAL instruments with silicon PIN detectors provide reliable analysis results and coating thickness readings even with small concentrations and very thin coatings. With their fast and highly precise XY(Z) measuring stage, they are ideally suited for automated sample measurements.
Typical areas of application are:
Analysis of very thin coatings, e.g. gold and palladium coatings of = 0.1 µm
Measurement of functional coatings in the electronics and semiconductor industries
Determination of complex multi-coating systems
Automated measurements, e.g. in quality control
Determination of the lead content in solder
$
9,250.00